Alexander Boettcher 4554ec42da nova: make write-combined unit test more robust
- touch all memory before time measurements, to reduce lazy paging jitter
- diff of 100us between 2 memset runs are now considered a failure (before 10us)
- add refrence measurements of same region size which is not write-combined
- make the output easier parse able of write-combined test

Fixes #5342
2024-10-08 09:09:22 +02:00
..
2024-08-27 15:29:37 +02:00
2024-06-20 12:54:30 +02:00