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Specify circuit test messages.
This commit is contained in:
Adam Ierymenko
parent
f69454ec98
commit
2d0adb562d
172
node/Packet.hpp
172
node/Packet.hpp
@ -553,10 +553,10 @@ public:
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* address that require re-establishing connectivity.
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*
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* Destination address types and formats (not all of these are used now):
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* 0 - None -- no destination address data present
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* 1 - Ethernet address -- format: <[6] Ethernet MAC>
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* 4 - 6-byte IPv4 UDP address/port -- format: <[4] IP>, <[2] port>
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* 6 - 18-byte IPv6 UDP address/port -- format: <[16] IP>, <[2] port>
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* 0x00 - None -- no destination address data present
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* 0x01 - Ethernet address -- format: <[6] Ethernet MAC>
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* 0x04 - 6-byte IPv4 UDP address/port -- format: <[4] IP>, <[2] port>
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* 0x06 - 18-byte IPv6 UDP address/port -- format: <[16] IP>, <[2] port>
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*
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* OK payload:
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* <[8] timestamp (echoed from original HELLO)>
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@ -904,7 +904,169 @@ public:
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*
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* OK and ERROR are not generated.
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*/
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VERB_PUSH_DIRECT_PATHS = 16
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VERB_PUSH_DIRECT_PATHS = 16,
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/* Source-routed circuit test message:
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* <[5] address of originator of circuit test>
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* <[2] 16-bit flags>
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* <[8] 64-bit timestamp>
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* <[8] 64-bit test ID (arbitrary, set by tester)>
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* <[1] originator credential type (for authorizing test)>
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* <[...] credential>
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* <[2] 16-bit length of additional fields>
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* <[...] additional fields>
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* <[2] 16-bit length of signature of request>
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* <[...] signature of request by originator>
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* <[1] previous hop credential type>
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* <[...] previous hop credential>
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* <[...] next hop(s) in path>
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*
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* Flags:
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* 0x01 - Report back to originator at each hop
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* 0x02 - Report back to originator at last hop
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*
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* Originator credential types:
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* 0x00 - No credentials included
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* 0x01 - 64-bit network ID for which originator is controller
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*
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* Previous hop credential types:
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* 0x00 - No credentials included
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* 0x01 - Certificate of network membership
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*
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* Path record format:
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* <[1] 8-bit flags>
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* <[1] 8-bit breadth (number of next hops)>
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* <[...] one or more ZeroTier addresses of next hops>
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*
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* Path record flags (in each path record):
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* 0x80 - End of path (should be set on last entry)
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*
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* The circuit test allows a device to send a message that will traverse
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* the network along a specified path, with each hop optionally reporting
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* back to the tester via VERB_CIRCUIT_TEST_REPORT.
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*
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* Each circuit test packet includes a digital signature by the originator
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* of the request, as well as a credential by which that originator claims
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* authorization to perform the test. Currently this signature is ed25519,
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* but in the future flags might be used to indicate an alternative
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* algorithm. For example, the originator might be a network controller.
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* In this case the test might be authorized if the recipient is a member
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* of a network controlled by it, and if the previous hop(s) are also
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* members. Each hop may include its certificate of network membership.
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*
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* Circuit test paths consist of a series of records. When a node receives
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* an authorized circuit test, it:
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*
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* (1) Reports back to circuit tester as flags indicate
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* (2) Reads and removes the next hop from the packet's path
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* (3) Sends the packet along to next hop(s), if any.
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*
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* It is perfectly legal for a path to contain the same hop more than
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* once. In fact, this can be a very useful test to determine if a hop
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* can be reached bidirectionally and if so what that connectivity looks
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* like.
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*
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* The breadth field in source-routed path records allows a hop to forward
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* to more than one recipient, allowing the tester to specify different
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* forms of graph traversal in a test.
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*
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* There is no hard limit to the number of hops in a test, but it is
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* practically limited by the maximum size of a (possibly fragmented)
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* ZeroTier packet.
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*
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* Support for circuit tests is optional. If they are not supported, the
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* node should respond with an UNSUPPORTED_OPERATION error. If a circuit
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* test request is not authorized, it may be ignored or reported as
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* an INVALID_REQUEST. No OK messages are generated, but TEST_REPORT
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* messages may be sent (see below).
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*
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* ERROR packet format:
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* <[8] 64-bit timestamp (echoed from original>
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* <[8] 64-bit test ID (echoed from original)>
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*/
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VERB_CIRCUIT_TEST = 17,
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/* Circuit test hop report:
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* <[8] 64-bit timestamp (from original test)>
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* <[8] 64-bit test ID (from original test)>
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* <[8] 64-bit reporter timestamp (reporter's clock, 0 if unspec)>
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* <[1] 8-bit vendor ID (set to 0, currently unused)>
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* <[1] 8-bit reporter protocol version>
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* <[1] 8-bit reporter major version>
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* <[1] 8-bit reporter minor version>
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* <[2] 16-bit reporter revision>
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* <[2] 16-bit reporter OS/platform>
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* <[2] 16-bit reporter architecture>
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* <[2] 16-bit error code (set to 0, currently unused)>
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* <[8] 64-bit report flags>
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* <[8] 64-bit source packet ID>
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* <[1] 8-bit source packet hop count>
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* <[1] 8-bit source address type>
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* [<[...] source address>]
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* <[2] 16-bit length of network information>
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* <[...] network information>
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* <[2] 16-bit length of additional fields>
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* <[...] additional fields>
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* <[2] 16-bit number of next hops to which something is being sent>
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* <[...] next hop information>
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*
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* Circuit test report flags:
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* (currently none, must be zero)
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*
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* Next hop information record format:
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* <[5] ZeroTier address of next hop>
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* <[1] 8-bit destination wire address type>
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* <[...] destination wire address>
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*
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* See enums below for OS/platform and architecture. Source address format
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* is the same as specified in HELLO.
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*
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* Circuit test reports can be sent by hops in a circuit test to report
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* back results. They should include information about the sender as well
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* as about the paths to which next hops are being sent.
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*
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* If a test report is received and no circuit test was sent, it should be
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* ignored. This message generates no OK or ERROR response.
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*/
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VERB_CIRCUIT_TEST_REPORT = 18
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};
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/**
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* Platforms reported in circuit tests
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*/
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enum CircuitTestReportPlatform
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{
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CIRCUIT_TEST_REPORT_PLATFORM_UNSPECIFIED = 0,
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CIRCUIT_TEST_REPORT_PLATFORM_LINUX = 1,
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CIRCUIT_TEST_REPORT_PLATFORM_WINDOWS = 2,
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CIRCUIT_TEST_REPORT_PLATFORM_MACOS = 3,
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CIRCUIT_TEST_REPORT_PLATFORM_ANDROID = 4,
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CIRCUIT_TEST_REPORT_PLATFORM_IOS = 5,
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CIRCUIT_TEST_REPORT_PLATFORM_SOLARIS_SMARTOS = 6,
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CIRCUIT_TEST_REPORT_PLATFORM_FREEBSD = 7,
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CIRCUIT_TEST_REPORT_PLATFORM_NETBSD = 8,
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CIRCUIT_TEST_REPORT_PLATFORM_OPENBSD = 9,
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CIRCUIT_TEST_REPORT_PLATFORM_RISCOS = 10,
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CIRCUIT_TEST_REPORT_PLATFORM_VXWORKS = 11,
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CIRCUIT_TEST_REPORT_PLATFORM_FREERTOS = 12,
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CIRCUIT_TEST_REPORT_PLATFORM_SYSBIOS = 13,
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CIRCUIT_TEST_REPORT_PLATFORM_HURD = 14
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};
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/**
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* Architectures reported in circuit tests
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*/
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enum CircuitTestReportArchitecture
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{
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CIRCUIT_TEST_REPORT_ARCH_UNSPECIFIED = 0,
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CIRCUIT_TEST_REPORT_ARCH_X86 = 1,
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CIRCUIT_TEST_REPORT_ARCH_X64 = 2,
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CIRCUIT_TEST_REPORT_ARCH_ARM32 = 3,
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CIRCUIT_TEST_REPORT_ARCH_ARM64 = 4,
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CIRCUIT_TEST_REPORT_ARCH_MIPS32 = 5,
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CIRCUIT_TEST_REPORT_ARCH_MIPS64 = 6,
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CIRCUIT_TEST_REPORT_ARCH_POWER32 = 7,
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CIRCUIT_TEST_REPORT_ARCH_POWER64 = 8
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};
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/**
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